Single-crystal x-ray diffraction of LaNiO2 at high pressure

Single-crystal x-ray diffraction data at high pressure were collected at the beamline ID27. The sample was a LaNiO2 crystal with size 50 × 50 × 30 μm^3. We used membrane driven diamond anvil cells with an angular opening of 70 degrees. These were equipped with single crystalline diamonds with culet sizes of 500 μm. Helium was used as pressure transmitting medium and the applied pressure was determined by ruby fluorescence. Monochromatic X rays with a wavelength of 0.3738 Å and a spot size of 1.5 × 1.8 μm^2 were scattered from the LaNiO2 crystal. Scattering intensities were collected in continuous rotation and shutterless mode using an Eiger9M detector (Dectris, Switzerland) equipped with 750 μm thick CdTe sensors with a pixel size of 75 × 75 μm2. The angular steps were 0.25 degree, spanning 64 degrees in total. The scattering geometry was calibrated using a CeO2 powder standard (NIST, USA) and a vanadinite single-crystal. The detector distance was 216.445 mm. Datasets T295_P0p32, T295_P5p93 and T295_P11p93 contain data of LaNiO2 at room temperature and pressures of 0.32, 5.93 and 11.93 GPa, respectively. Datasets for the calibration are CeO2_260422 (CeO2) and van_calib_260422/0001 (vanadinite). These were taken from experiment HC-4887.