Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

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Authors: E10 Committee
Cited by: 0

Abstract

Significance and Use5.1 This practice is important in characterizing the radiation hardness of electronic devices irradiated by neutrons. This characterization makes it feasible to predict some changes in operational properties of irradiated semiconductor

Fields of Study & Subjects

Radiation Effects in Electronics Radiation Therapy and Dosimetry Radiation Detection and Scintillator Technologies

Publication details

Publication date
1 February 2026
Language
EN