High-throughput Microstructural Characterization of xSi-BN Coated SiC Fibers by Combining Scanning Electron Microscopy and Laser Scanning Confocal Microscopy
Abstract
界面层硬度从 14.91 GPa 显著降 低至 8.06 GPa；当 Si 含量达到 11%时，界面剪切强度从 32.76 MPa 大幅提升至 109.07MPa。该技术为 SiCf/SiC
Fields of Study & Subjects
Advanced ceramic materials synthesis
Silicon Carbide Semiconductor Technologies
Mechanical Behavior of Composites
Publication details
- Journal / source
- Journal of Inorganic Materials
- Pages
- 457–457
- Publication date
- 1 January 2026
- Language
- EN