Mechanical and electrical properties of copper oxide thin films formed by thermal oxidation

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Authors: Morgan Rusinowicz, F. Volpi, Guillaume Parry, Chaymaa Boujrouf, Thomas Bernard, M. Verdier, Muriel Braccini
Cited by: 2
References: 84

Fields of Study & Subjects

Copper-based nanomaterials and applications Dielectric properties of ceramics Copper Interconnects and Reliability

Publication details

Journal / source
Journal of materials research/Pratt's guide to venture capital sources
Publisher
Springer Science and Business Media LLC
Volume
41
Issue
5
Pages
866–880
Publication date
12 February 2026
Language
EN