Authors:
Antonio Moreno‐Muñoz, University of Cordoba, Spain; Adil Khurram, University of California San Diego, USA; Jianli Chen, Commonwealth Edison (ComEd), USA; Fei Wang, North China Electric Power University, China; Gang Huang, Zhejiang University, China; Han Li, Lawrence Berkeley National Laboratory
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USA; Haoran Ji, Tianjin University, China; Hongda Ren, Schweitzer Engineering Laboratories, USA; Hongxun Hui, University of Macau, Jan P. Kleissl, University of California, San Diego, USA; Jianli Chen, University of Utah, USA; Jiazuo Hou, Tongji University, China; Jin Dong, Oak Ridge National Laboratory, Keaton Chia, UCSD DERConnect Testing Facility, USA; Laiz Souto, University of Bath, United Kingdom; Xiangyu Zhang, University of Arizona, Mayank Sharma, Schneider Electric, France; Mohammad Zeyad, Heriot-Watt University, United Kingdom; Ramtin Hadidi, Clemson University, USA; Ruiwen Liu, University of Macau, China; Shafi Khadem, International Energy Research Centre, Ireland; Shunbo Lei, The Chinese University of Hong Kong, Shenzhen, China; S.M. Masum Ahmed, Heriot-Watt University, United Kingdom; Xiangyu Zhang, Southeast University, China; Yichen Zhang, University of Texas at Arlington, Young‐Jin Kim, Pohang University of Science and Technology, Korea; Yue Song, Tongji University, China; Zhendong Zhao, South China University of Technology, China
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