Addressing TIM Degradation in Lifetime Prediction of Data Center CPU/GPUs: Testing Methodology, Failure Definition and Performance of TIMs
Fields of Study & Subjects
Reliability and Maintenance Optimization
Electronic Packaging and Soldering Technologies
Parallel Computing and Optimization Techniques
Publication details
- Journal / source
- IEEE RESOURCE CENTERS
- Publication date
- 3 March 2026
- Language
- EN