Deterministic Bias in LLM Alignment: Empirical Evidence of Pattern-over-Reasoning Override

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Authors: Chern Siow Shyen
Cited by: 1

Abstract

This work presents empirical evidence of deterministic bias in LLM alignment, demonstrating how pattern-matching behaviors can override reasoning processes. It serves as a foundational component within a broader framework of AI system dynamics, contributing to the understanding of capability shaping, bias formation, and structural constraints in aligned models.

Fields of Study & Subjects

Child and Animal Learning Development Logic Reasoning and Knowledge Explainable Artificial Intelligence (XAI)

Publication details

Publication date
1 January 2026
Document type
Preprint