The effect of pattern quality on measurements of stress heterogeneity and geometrically necessary dislocation density by high-angular resolution electron backscatter diffraction.
Fields of Study & Subjects
Advanced Materials Characterization Techniques
Microstructure and mechanical properties
Electron and X-Ray Spectroscopy Techniques
Publication details
- Journal / source
- Apollo (University of Cambridge)
- Publication date
- 10 February 2026
- Language
- EN