Temperature and electron concentration dependences of 1/f noise in Hg1−xCdxTe – evidence for a mobility fluctuations mechanism
Abstract
This is a set of research data related to the article titled " Temperature and electron concentration dependences of 1/f noise in Hg1−xCdxTe – evidence for a mobility fluctuations mechanism", Nanoscale, 2025,17, 7281-7288.README.txt file contains detailed description of all dataset attached
Fields of Study & Subjects
Advanced Semiconductor Detectors and Materials
Semiconductor materials and devices
Semiconductor materials and interfaces
Publication details
- Journal / source
- RepOD
- Publication date
- 1 January 2026
- Document type
- Dataset