AFM, TEM and DLS data from: Studies upon fluorescent modulation of silver nanoclusters formed on bifunctional DNA template

This dataset contains raw AFM, TEM and DLS data, that had been published in "Studies upon Fluorescent Modulation of Silver Nanoclusters Formed on Bifunctional DNA Template".Atomic Force Microscope (AFM) MeasurementsThe surface topography of the samples was investigated using an atomic force microscope (Nanowizard IV, Bruker, formerly JPK, Berlin, Germany) operating in tapping mode. Sample preparation involved deposition on thoroughly cleaned mica surfaces. Before the sample application, the mica surface was functionalized with 10 mM CaCl₂ solution for 5 min and then rinsed with Millipore-grade water. The samples were then loaded onto the functionalized mica surface and incubated for 2 min, followed by another rinsing step with Millipore water. The prepared samples were left to air-dry at room temperature before AFM imaging. All measurements were performed using HQ:NSC35/No Al probes (Innovative Solutions Bulgaria Ltd., Sofia, Bulgaria) with 3 different soft-tapping mode AFM Cantilevers (radius < 8 nm), with spring constants of 0.5, 1, and 2 N/m and resonant frequencies of 65, 90, and 130 kHz, respectively. AFM images were recorded with a resolution of 512 × 512. Samples were prepared 24 h before measurement, stored in a refrigerator, and measured immediately after temperature stabilization without further purification.Images were processed and analyzed using JPK Data Processing and Gwyddion v2.67 software (http://gwyddion.net/, accessed on 15 May 2025). In Gwyddion, the following operations were performed: level data by mean plane subtraction, align rows using various methods, shift maximum data value to zero, stretch color range to part of data with explicitly fixed color range, extract profiles along arbitrary lines, align and level profiles followed by averaging, and fit Gaussian function to the averaged data.Dynamic Light Scattering DLS MeasurementsDLS measurements were performed using the particle analyzer Litesizer™ 500 from Anton Paar (Anton Paar, Graz, Austria) equipped with a 658 nm diode laser with a power of 40 mW. The temperature of the samples during the DLS measurement was set at 20 °C. Detection of scattered light at an angle of 90° was automatically adjusted by the Litezer optical system. The particle size distribution was measured in a low-volume quartz cuvette. Kalliope Professional (Anton Paar, version 3.2.5) software was used to collect and analyze the data. All measurements were performed in PBS buffer (pH 7.4). Samples were prepared 24 h before measurement, stored in a refrigerator, and measured immediately after temperature stabilization without further purification.The files:Fig_S8_c12tel22_Size distribution function.xlsxFig_S8_C12TBA_Size distribution function.xlsxcontains size intensity, volume and number weighted distribution functions of C12TBA-AgNCs and C12Tel22-AgNCs samples. The intensity distributions functions were published in the "Studies upon Fluorescent Modulation of Silver Nanoclusters Formed on Bifunctional DNA Template" in Figure 8 of the supplement.All data were extracted from the APKW file, which is the original Kalliope software of the Anton Paar Litesizer™ 500. Transmission Electron Microscopy (TEM) Microscope MeasurementsTEM measurements were collected and processed at the SOLARIS National Synchrotron Radiation Centre (Krakow, Poland). The cryoEM images were collected using the Glacios Cryo-TEM microscope (nominal magnification 150,000× g) operated with a 200 kV X-FEG source (Thermo Fisher Scientific, Waltham, MA, USA). The C12Tel22-AgNCs solution (volume 3 μL) was applied without dilution onto grids (carbon/Cu, mesh 200) and vitrified using Vitro-bot MkIV (Thermo Fisher Scientific, Waltham, MA, USA).