Characterization of a Monolithically Integrated MEMS X-ray Source

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Authors: Paweł Urbański
Cited by: 0

Abstract

These data contain measurements and characterization results from the development of a monolithically integrated MEMS X-ray source combining a field emission cathode, electron-optical column, transmission X-ray target, and an integrated ion-sorption pump within a single self-contained vacuum microsystem. The dataset includes emission current and stability data, vacuum condition measurements, X-ray spectral data, and operational parameters gathered during device evaluation. These measurements document the performance and stability of the MEMS X-ray source under various electrical conditions, including how emission and vacuum levels influence key properties of generated X-rays such as intensity and spectral energy distribution.

Fields of Study & Subjects

Advanced MEMS and NEMS Technologies Electron and X-Ray Spectroscopy Techniques Photocathodes and Microchannel Plates

Publication details

Journal / source
RepOD
Publication date
1 January 2026
Language
EN
Document type
Dataset