Designing Defect Structure and Interfacial Strain in an Epitaxial VN Bilayer Film by Tailoring N Concentration

Advanced Materials Interfaces 2026 Open access

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Authors: Marcus Hans, Damian M. Holzapfel, Zhuo Chen, Soheil Karimi Aghda, Michal Fečík, Daniel Primetzhofer, Zaoli Zhang, Jochen M. Schneider

DOI: 10.18154/rwth-2026-00333

Cited by: 0

Fields of Study & Subjects

Metal and Thin Film Mechanics 2D Materials and Applications GaN-based semiconductor devices and materials