Compensating Streak Artifacts in Sparse-View Inline Industrial CT for Accurate Metrology using Self-Supervised Optimization of Implicit Neural Volume Representations
Fields of Study & Subjects
Advanced X-ray and CT Imaging
Optical measurement and interference techniques
Advanced Measurement and Metrology Techniques
Publication details
- Journal / source
- Journal of Nondestructive Evaluation
- Publication date
- 1 January 2026
- Language
- EN