Estimation of Indium Composition in GaxIn1-xN/GaN Layers from V-Pit Diameter Measurements

Research Square 2026 Preprint Open access

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Authors: Ravi Kumar
DOI: 10.21203/rs.3.rs-8681147/v1
Cited by: 0
References: 32

Fields of Study & Subjects

GaN-based semiconductor devices and materials Silicon Carbide Semiconductor Technologies Metal and Thin Film Mechanics

Publication details

Journal / source
Research Square
Publication date
27 January 2026
Document type
Preprint