"Data"

IEEE DataPort 2026 Dataset Open access

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Authors: Alireza Mehrabi
DOI: 10.21227/x573-hv10
Cited by: 0

Abstract

"The file contains reliability test results for a GaN device, a SiC device, and an IGBT, as well as data related to a DC\u2013DC buck converter simulated in MATLAB."

Publication details

Journal / source
IEEE DataPort
Publication date
5 January 2026
Document type
Dataset