FPGA-Based Reliability Enhancement of SRAM-Emulated TCAMs Using Hamming Code Error Correction

SRAM-emulated Ternary Content Addressable Memories (TCAMs) are a cost-effective and flexible alternative to conventional TCAMs for high-speed data search applications, particularly in networking and embedded systems. However, these SRAM-based architectures are prone to soft errors, which can compromise system reliability by introducing incorrect matches. This paper proposes an error correction framework based on Hamming codes to detect and correct single-bit errors within SRAM-emulated TCAM cells. The entire design is modeled and implemented on a Xilinx Artix-7 FPGA using Verilog HDL, with an emphasis on maintaining low latency and minimal resource overhead. Simulation results and hardware synthesis demonstrate high error correction accuracy, improved system robustness, and efficient utilization of FPGA resources. The proposed method provides a practical solution for ensuring fault-tolerant performance in real-time and mission-critical applications.