An explainable AI-based integrated framework for defect inspection: ROI extraction, segmentation, and defect classification

SSRN Electronic Journal 2026 Preprint Open access

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Authors: Soohyeon Park, Youngwoo Kim

DOI: 10.2139/ssrn.6022282

Cited by: 0

References: 22

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Image and Object Detection Techniques

References 22