Effect of 100 keV Helium Ions on Be/Si/Al Multilayer X-ray Mirrors
Fields of Study & Subjects
Ion-surface interactions and analysis
Advanced X-ray Imaging Techniques
X-ray Spectroscopy and Fluorescence Analysis
Publication details
- Journal / source
- SSRN Electronic Journal
- Publication date
- 1 January 2026
- Document type
- Preprint