A High-Reliability SiC Trench MOSFET IntegratingLateral JBS Diode With Enhanced ReverseConduction and Short-Circuit Capability

SSRN Electronic Journal 2026 Preprint Open access

Read full text

Authors: Jinlan Li, Huaren Sheng, Yan Xu, Quanzhi Chen, Ling Jiao Dong, Yiming Shi, Liming Zhou

DOI: 10.2139/ssrn.6148541

Cited by: 0

References: 25

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Semiconductor materials and interfaces GaN-based semiconductor devices and materials

References 25