Wafer-YOLO: A Lightweight Object Detection Network for Wafer Inspection

SSRN Electronic Journal 2026 Preprint Open access

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Authors: Xiaotong Shu, Zhenzhi He, Jiayi Yuan, Guo Ye, Tianchi Chen, Lianchao Sheng, Xiangning Lu
DOI: 10.2139/ssrn.6151450
Cited by: 0
References: 10

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Infrastructure Maintenance and Monitoring

Publication details

Journal / source
SSRN Electronic Journal
Publication date
1 January 2026
Document type
Preprint