Determination of the L-shell intensity ratios of doped tungsten oxide thin films using X-ray fluorescence (XRF) technique

SSRN Electronic Journal 2026 Preprint Open access

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Authors: Betül DEMIREZEN, Ömer Söğüt, Mustafa Kavgacı, Ali Gürol

DOI: 10.2139/ssrn.6182158

Cited by: 0

References: 13

Fields of Study & Subjects

X-ray Spectroscopy and Fluorescence Analysis Electron and X-Ray Spectroscopy Techniques X-ray Diffraction in Crystallography

References 13