CGSIM Orthogonal Simulation Study on the Influence of High-Frequency Defects in VGF-InP Single Crystal Growth

SSRN Electronic Journal 2026 Preprint Open access

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Authors: Hua Wei, Chenxuan Duan, Bin Yang, Chong Wang, X.L. Ye, Xingkai Zhao, Hanbao Liu, Feng Qiu, Jie Yang, Feng Hui, Rui Xu, Ting Long Liu
DOI: 10.2139/ssrn.6192883
Cited by: 0
References: 9

Fields of Study & Subjects

Solidification and crystal growth phenomena Advanced Semiconductor Detectors and Materials Crystallization and Solubility Studies

Publication details

Journal / source
SSRN Electronic Journal
Publication date
1 January 2026
Document type
Preprint