An Event-Anchored Machine Learning based New Approach for Robust Real-Time Quality Prediction in Cyclic Manufacturing
Fields of Study & Subjects
Fault Detection and Control Systems
Advanced Statistical Process Monitoring
Industrial Vision Systems and Defect Detection
Publication details
- Journal / source
- SSRN Electronic Journal
- Publication date
- 1 January 2026
- Language
- EN
- Document type
- Preprint