Influence of thickness on structural, electrical and optical properties of VO2 films grown on TiO2-buffered c-Al2O3 substrates

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Authors: M. E. Kutepov, Vladimir E. Kaydashev, Daniil Striukov, Alexey S. Konstantinov, Anatoliy Nikolskiy, Alexey Titovich Kozakov, Alexander Morozov, Ivan K. Domaratskiy, Sergey S. Zhukov, Evgeni M. Kaidashev
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References: 18

Fields of Study & Subjects

Transition Metal Oxide Nanomaterials Advanced Memory and Neural Computing Phase-change materials and chalcogenides

Publication details

Journal / source
SSRN Electronic Journal
Publication date
1 January 2026
Language
EN
Document type
Preprint