Effect of Al doping on the natural growth direction of 6H-SiC crystals: From the DFT Calculation to Experiment
Abstract
To achieve the regulation of 6H-SiC crystal morphology at low temperatures in the Acheson process, this study investigates the growth direction evolution of 6H-SiC by altering the surface energy differences between crystal planes through Al doping, using a combination of density functional theory (DFT) calculations and experimental methods. DFT results indicate that Al doping exerts differential effects on the surface energies of 6H-SiC crystal planes via electron distribution adjustment and chemical bond reconstruction, thereby influencing the growth direction of 6H-SiC. This mechanism provides a theoretical basis for controlling crystal growth direction through doping. Experimental results demonstrate that Al doping alters the natural growth direction of 6H-SiC from the <10-10> direction to gradient growth along the <0001> direction.
Fields of Study & Subjects
Silicon Carbide Semiconductor Technologies
RNA modifications and cancer
Ga2O3 and related materials
Publication details
- Journal / source
- SSRN Electronic Journal
- Publisher
- Elsevier BV
- Publication date
- 1 January 2026
- Document type
- Preprint