Automated Detection and Evaluation of Internal Stress in Large Sapphire Crystals via Conoscopic Interference Imaging and DynaDet-Net

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Authors: Jixiang Zhao, Sen Kang, Tianhu Shi, Weitong Xu, Xin Liu, Xiaoyu Chen, Dong Pan, Jianqiao Meng, Yuxia Duan
Cited by: 0
References: 14

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Optical measurement and interference techniques

Publication details

Journal / source
SSRN Electronic Journal
Publication date
1 January 2026
Language
EN
Document type
Preprint