Uncertainty quantification for inverse problems with application to ptychographic reconstruction

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Authors: USDOE Office of Science (SC), Zichao Wendy Di, Matthew Cherukara, Tao Zhou
Cited by: 0

Fields of Study & Subjects

Numerical methods in inverse problems Advanced X-ray Imaging Techniques X-ray Diffraction in Crystallography

Publication details

Publication date
1 February 2026
Language
EN