Advanced testing and validation frameworks for high-reliability multi-board electronic systems

Multi-board digital systems with high reliability are being used in more safety-critical and mission-critical systems, with the failure of such systems potentially having disastrous effects. The conventional rule based and late-stage testing methods cannot handle the increasing system complexity, environmental challenges, and security threats. The paper is a secondary research study of better-level testing and validation structures including intelligent PCB design verification, X-in-the-loop and digital twin-based system validation, fault injection and fuzzing, and non-ideal condition reliability check. The paper summarises the recent research in several areas and reveals the strong points, shortcomings and gaps in integration in the current practice. The results identify the necessity of cross-lifecycle-wide validation frameworks of complex multi-board electronic systems in order to improve key areas of reliability, safety, and resilience.