Introduction to scanning fluorescence X-ray microscopy and its applications for earth and planetary science
Abstract
Scanning Fluorescence X-ray Microscopies (SFXM) are capable of high-spatial-resolution and high-sensitivity elemental mapping, as well as obtaining information on the chemical state of elements in the submicron range, from light to heavy elements. There appears to have the advantage of being relatively free of limitations on sample size or surface polishing, and of being easy to control the measurement atmosphere for both solids and solutions. This article introduces the principles of the analytical method, an overview of the equipment, and examples of its application to solid samples both inside and outside the Earth.
Fields of Study & Subjects
Advanced X-ray Imaging Techniques
X-ray Spectroscopy and Fluorescence Analysis
Crystallography and Radiation Phenomena
Publication details
- Journal / source
- Japanese Magazine of Mineralogical and Petrological Sciences
- Publisher
- Japan Association of Mineralogical Sciences
- Volume
- 55
- Issue
- 1
- Pages
- n/a–n/a
- Publication date
- 1 January 2026
- Language
- EN