Design and stochastic performance analysis of non-ideal ultra-lift Luo converter: A Monte Carlo approach
Abstract
Abstract This paper presents the design and a comprehensive stochastic performance assessment of the non-ideal Ultra-Lift Luo (ULL) converter. The study emphasizes the impact of component tolerances and non-idealities on the uncertainties induced in the overall performance of the ULL converter, which is systematically evaluated using a Monte Carlo-based simulation framework. Unlike conventional deterministic analyses based on nominal component values, the proposed methodology develops a non-ideal model of the ULL converter by accounting for inductor winding resistance R L , capacitor equivalent series resistance r c , and MOSFET non-idealities, such as ON-state resistance R DS ON , gate charge Q G , drain-source voltage V DS , drain-source current I DS and load resistance R 0 . Monte Carlo analysis is employed to evaluate the effects of component tolerances and non-idealities on the output voltage ripple, output-voltage stress and efficiency of the non-ideal ULL converter, demonstrating the sensitivity and robustness of the non-ideal ultra-lift topology under practical manufacturing variations.
Fields of Study & Subjects
Advanced DC-DC Converters
Low-power high-performance VLSI design
Silicon Carbide Semiconductor Technologies
Publication details
- Journal / source
- Journal of Electrical Engineering
- Publisher
- Walter de Gruyter GmbH
- Volume
- 77
- Issue
- 1
- Pages
- 89–96
- Publication date
- 1 February 2026
- Language
- EN