High-Accuracy Dual-Split-Ring-Resonator Microwave Sensor for Permittivity Characterization and Defect Detection in Solid Materials
Fields of Study & Subjects
Microwave and Dielectric Measurement Techniques
RFID technology advancements
Near-Field Optical Microscopy
Publication details
- Journal / source
- Progress In Electromagnetics Research M
- Publisher
- The Electromagnetics Academy
- Volume
- 138
- Pages
- 75–86
- Publication date
- 1 January 2026
- Language
- EN