A dropout uncertainty neural network (DUNN) model driver v001

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Authors: Mingjian Wen, Ellad B. Tadmor
Cited by: 0

Abstract

A dropout uncertainty neural network (DUNN) potential model driver, which supports running in both fully-connected mode and dropout mode. The DUNN can be used easily to quantify the uncertainty in atomistic simulations and determine the transferability of potential.

Fields of Study & Subjects

Machine Learning in Materials Science Advanced Chemical Physics Studies Model Reduction and Neural Networks

Publication details

Journal / source
Open Knowledgebase of Interatomic Models (OpenKIM)
Publication date
1 January 2026