Particle size metrology and statistical modelling of low energy electrons in scanning electron microscopy
Abstract
Particle size metrology and statistical modelling of low energy electrons in scanning electron microscopy
Fields of Study & Subjects
Electron and X-Ray Spectroscopy Techniques
Advanced Electron Microscopy Techniques and Applications
Scientific Measurement and Uncertainty Evaluation
Publication details
- Journal / source
- Loughborough University Research Repository (Loughborough University)
- Publication date
- 3 March 2026
- Language
- EN
- Document type
- Thesis