Particle size metrology and statistical modelling of low energy electrons in scanning electron microscopy

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Authors: Imoleayomide Ajayi
Cited by: 0

Abstract

Particle size metrology and statistical modelling of low energy electrons in scanning electron microscopy

Fields of Study & Subjects

Electron and X-Ray Spectroscopy Techniques Advanced Electron Microscopy Techniques and Applications Scientific Measurement and Uncertainty Evaluation

Publication details

Journal / source
Loughborough University Research Repository (Loughborough University)
Publication date
3 March 2026
Language
EN
Document type
Thesis