Appendix to: Computer vision and machine learning techniques for optical micrograph defect classification using a novel gray thresholding technique

This is supplementary material for https://doi.org/10.1007/s40192-026-00474-1. This page contains two zip files with: * Classification Code -- Machine Learning pipeline for Optical Micrograph Defect Classification * Optimal Gray Threshold -- Novel method for finding threshold values in grayscale images for Optical Micrographs Each ZIP contains code, data, and a README for specific implementations.