Datenqualität und Expertise für robusten KI-Einsatz – Integration von Anomalie- und Label-Fehlererkennung in industrielle Defektdetektion
Fields of Study & Subjects
Industrial Vision Systems and Defect Detection
Fault Detection and Control Systems
Non-Destructive Testing Techniques
Publication details
- Journal / source
- Industry 4 0 Science
- Volume
- 2026
- Issue
- 1
- Publication date
- 11 February 2026
- Language
- DE