Application of Machine Learning Algorithms to Obtain the EEDF from the I–V Characteristics of a Langmuir Probe

Bulletin of the Lebedev Physics Institute 2026

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Authors: A.V. Bernatskiy, I.I. Draganov, P. G. Ivanov, V.V. Lagunov, V.N. Ochkin

DOI: 10.3103/s1068335626600117

Cited by: 1

References: 16

Fields of Study & Subjects

Advancements in Semiconductor Devices and Circuit Design Silicon Carbide Semiconductor Technologies Electrostatic Discharge in Electronics

References 16