Attention-Enhanced YOLOv8-Seg with WGAN-GP-Based Generative Data Augmentation for High-Precision Surface Defect Detection on Coarsely Ground SiC Wafers
Abstract
Quality control plays a critical role in modern manufacturing. With the rapid development of electric vehicles, 5G communications, and the semiconductor industry, high-speed and high-precision detection of surface defects on ... | Find, read and cite all the research you need on Tech Science Press
Fields of Study & Subjects
Industrial Vision Systems and Defect Detection
Advanced Neural Network Applications
Infrastructure Maintenance and Monitoring
Publication details
- Journal / source
- Computers, materials & continua/Computers, materials & continua (Print)
- Volume
- 87
- Issue
- 2
- Pages
- 1–10
- Publication date
- 1 January 2026
- Language
- EN