Symmetrized Extrinsic Information Transfer Chart Analysis for Joint Decoding Between LDPC Codes and CCDMs

Read full text
Authors: Gang Yang, Fei Yang, Yanan Luo
Cited by: 0
References: 16

Abstract

This paper proposes a symmetrized extrinsic information transfer (S-EXIT) chart analysis for probabilistic shaped (PS) systems to optimize the joint decoding of low-density parity-check (LDPC) codes and constant composition distribution matchers (CCDMs). A major challenge in analyzing PS systems is the non-uniform channel input caused by shaping, which invalidates the all-zero assumption of traditional EXIT charts, coupled with the three-node structure of the joint decoder (variable nodes, check nodes, and shaping nodes) that exceeds the two-decoder framework of conventional EXIT analysis. To resolve these issues, we first prove the symmetry of the joint decoder and introduce a “symmetrized density” transformation to render the channel output symmetric, thereby enabling the extension of EXIT chart analysis to PS systems. We then approximate the EXIT function of the shaping node decoder via polynomial fitting and integrate it with the variable node decoder into a unified model (VSND) for threshold analysis. On one hand, the proposed S-EXIT chart provides a theoretical threshold for the joint decoder, which is crucial for guiding system design. On the other hand, it enables the joint optimization of LDPC code rates and CCDM rates, unlocking additional performance gains. Simulations over additive white Gaussian noise (AWGN) channels demonstrate that short-blocklength CCDMs (e.g., blocklength 20) achieve up to 1.2 dB gain over uniform systems via S-EXIT-based rate optimization. This work addresses the performance limitations of short-blocklength CCDMs in high-speed optical transmissions, offering a practical and efficient analytical tool for PS system design.

Fields of Study & Subjects

Error Correcting Code Techniques Optical Network Technologies Advanced Wireless Communication Techniques

Publication details

Journal / source
Electronics
Volume
15
Issue
1
Pages
228–228
Publication date
4 January 2026
Language
EN