A Convolutional Neural Network(CNN)–Residual Network (ResNet)-Based Faulted Line Selection Method for Single-Phase Ground Faults in Distribution Network

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Authors: Qianqiu Shao, Zhen Yu, Shenfa Yin
Cited by: 0
References: 30

Abstract

Single-phase ground faults account for more than 80% of total faults in distribution networks. However, the introduction of distributed generation complicates power grid topology, leading to strong nonlinearity and non-stationarity in the zero-sequence current. This limits the accuracy of traditional faulted line selection methods. To address this problem, a CNN–ResNet-based method for faulted line selection for single-phase ground faults in distribution networks is proposed. Firstly, a 10 kV arc ground fault simulation test platform is built to analyze the nonlinear distortion characteristics of fault current. The WOA–VMD algorithm, optimized by permutation entropy, is used to denoise the zero-sequence current signal. The Gram Angular Difference Field (GADF) is then adopted to convert the one-dimensional signal into a two-dimensional image that retains its temporal characteristics. A hybrid deep learning model is constructed by fusing the one-dimensional time-domain features extracted by CNN and the two-dimensional time-frequency image features extracted by ResNet34. Matlab/Simulink simulations and physical experimental verification demonstrate that the proposed method achieves a training accuracy of over 97%, with zero misjudgments recorded in 15 arc grounding fault tests, representing a significant improvement in accuracy compared with existing diagnostic algorithms. It can adapt to complex scenarios such as high-resistance grounding and changes in neutral point grounding mode, effectively improving the accuracy and robustness of faulted line selection and providing technical support for the safe operation of distribution networks.

Fields of Study & Subjects

Power Systems Fault Detection Electrical Fault Detection and Protection Power Quality and Harmonics

Publication details

Journal / source
Electronics
Volume
15
Issue
5
Pages
1090–1090
Publication date
5 March 2026
Language
EN