A Comprehensive Review of Reliability Analysis for Pulsed Power Supplies

Achieving high reliability remains the critical challenge for pulsed power supplies (PPS), whose core components are susceptible to severe degradation and catastrophic failure due to long-term operation under electrical, thermal and magnetic stresses, particularly those associated with high voltage and high current. This reliability challenge fundamentally limits the widespread deployment of PPSs in defense and industrial applications. This article provides a comprehensive and systematic review of the reliability challenges and recent technological progress concerning PPSs, focusing on three hierarchical levels: component, system integration, and extreme operating environments. The review investigates the underlying failure mechanisms, degradation characteristics, and structural optimization of key components, such as energy storage capacitors and power switches. Furthermore, it elaborates on advanced system-level techniques, including novel thermal management topologies, jitter control methods for multi-module synchronization, and electromagnetic interference (EMI) source suppression and coupling path optimization. The primary conclusion is that achieving long-term, high-frequency operation depends on multi-physics field modeling and robust, integrated design approaches at all three levels. In summary, this review outlines important research directions for future advancements and offers technical guidance to help speed up the development of next-generation PPS systems characterized by high power density, frequent repetition, and outstanding reliability.