Point Cloud Quality Assessment via Complexity-Driven Patch Sampling and Attention-Enhanced Swin-Transformer

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Authors: Xilei Shen, Qiqi Li, Renwei Tu, Yongqiang Bai, Di Ge, Zhongjie Zhu
Cited by: 1
References: 15

Abstract

As an emerging immersive media format, point clouds (PC) inevitably suffer from distortions such as compression and noise, where even local degradations may severely impair perceived visual quality and user experience. It is therefore essential to accurately evaluate the perceived quality of PC. In this paper, a no-reference point cloud quality assessment (PCQA) method that uses complexity-driven patch sampling and an attention-enhanced Swin-Transformer is proposed to accurately assess the perceived quality of PC. Given that projected PC maps effectively capture distortions and that the quality-related information density varies significantly across local patches, a complexity-driven patch sampling strategy is proposed. By quantifying patch complexity, regions with higher information density are preferentially sampled to enhance subsequent quality-sensitive feature representation. Given that the indistinguishable response strengths between key and redundant channels during feature extraction may dilute effective features, an Attention-Enhanced Swin-Transformer is proposed to adaptively reweight critical channels, thereby improving feature extraction performance. Given that traditional regression heads typically use a single-layer linear mapping, which overlooks the heterogeneous importance of information across channels, a gated regression head is designed to enable adaptive fusion of global and statistical features via a statistics-guided gating mechanism. Experiments on the SJTU-PCQA dataset demonstrate that the proposed method consistently outperforms representative PCQA methods.

Fields of Study & Subjects

3D Shape Modeling and Analysis Computer Graphics and Visualization Techniques Optical measurement and interference techniques

Publication details

Journal / source
Information
Publisher
MDPI AG
Volume
17
Issue
1
Pages
93–93
Publication date
15 January 2026
Language
EN