A Sensitivity-Inspired Parameter Identification Method for the Single-Diode Model of Photovoltaic Modules

Parametrization of photovoltaic (PV) modules makes an important foundation for monitoring and fault diagnosis. This work focus on the sensitivity of parameters for the single-diode model (SDM), which fills the gap in existing research. The sensitivity analysis in this work provides a fundamentally new perspective on understanding parameter robustness as well as the prior knowledge for the parameter identification method. Based on insights into the sensitivity analysis, a novel parameter identification method is proposed, which combines analytical expressions with the grid search algorithm. The proposed method reduces the relative error of the extracted parameters in the simulated dataset, and the quantitative improvement of the reverse saturation current is significant (12.6% average reduction). This method achieves the state-of-the-art overall performance in the measured dataset, and the Friedman test confirms that this improvement is statistically significant (p < 0.05). The transition capability of the proposed method is excellent under varying operating conditions, which implies that it has the potential to be applied to the intelligent operation and maintenance of photovoltaic systems.