Compact Digital Holography-Based Refractometer for Non-Invasive Characterization of Transparent Media

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Authors: Brandon R. Sulvarán-Salmoreno, Diego Torres-Armenta, Dulce González-Utrera, David Moreno-Hernández
Cited by: 1
References: 45

Abstract

This work presents a compact refractometric system based on In-Line Digital Holography (ILDH) for the non-invasive characterization of transparent media, encompassing both liquids and high-refractive-index optical glasses. The core of the system is a cost-effective, lensless setup in which a 532 nm laser source and a microscope objective generate a divergent spherical wavefront that illuminates a 10 μm aluminum particle. The resulting diffraction pattern, modulated by samples in the optical path, is recorded by a CMOS sensor. The refractive index of the sample is determined by numerically locating the axial position of the particle-reconstructed image, which directly corresponds to the optical path difference introduced by the test medium. The optimal reconstruction plane is objectively located using an autofocus algorithm based on the Kurtosis metric, which identifies the sharpest image. The system successfully characterizes media across a broad refractive index range from 1.33 to 1.78, yielding linear calibration curves for both liquid and solid samples. The instrument achieves an axial reconstruction resolution of 30 μm and a refractive index precision of ±0.01 RIU. This ILDH approach offers a highly portable, cost-effective, and non-contact solution for refractive index measurement, demonstrating significant potential for industrial quality control and high-throughput point-of-care applications.

Fields of Study & Subjects

Digital Holography and Microscopy Optical measurement and interference techniques Advanced X-ray Imaging Techniques

Publication details

Journal / source
Optics
Publisher
MDPI AG
Volume
7
Issue
1
Pages
6–6
Publication date
9 January 2026
Language
EN