Extending Photovoltaic Module Lifetime Through Targeted Repair of Short-Circuited Bypass Diodes

Bypass diode failure, particularly in the short-circuit mode, remains an under-addressed reliability issue in photovoltaic (PV) modules, causing severe power suppression and often leading to premature disposal of otherwise functional units. This study presents a non-destructive, field-applicable plug-in repair protocol for restoring modules affected by short-circuited bypass diodes. From twenty-two field-deployed modules, nine were analyzed in detail under healthy, single-fault, and dual-fault conditions. Controlled diode faults were introduced and subsequently repaired using commercially available plug-in bypass diodes. Electroluminescence (EL) imaging, current–voltage (I–V) testing, and extraction of series and shunt resistances were performed before and after repair. Results show that a single shorted diode deactivates one substring, reducing power by ~34–37%, while dual faults suppress over two-thirds of the active area, causing power losses above 67%. After repair, power deviation decreased to