Full-Process Detection Technologies for Micro-LED Advanced Manufacture

Research 2026 Open access

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Authors: Hao Su, Jie Li, Wei Huang, Shuqian Zhang, Jiawen Qiu, Kun Wang, Yongai ZHANG, Xiongtu Zhou, Tailiang Guo, Chaoxing Wu
DOI: 10.34133/research.1214
Cited by: 3
References: 70

Abstract

With the continuous advancement of micro-light-emitting diode (Micro-LED) manufacturing technology, Micro-LED displays are poised to emerge as the next-generation display technology, making important strides in areas such as near-eye displays, large-scale high-definition devices, and flexible screens. Among the various technical challenges associated with Micro-LED displays, detection plays a crucial role in identifying defective pixels, improving yield, and reducing overall production costs. Given that Micro-LED chip arrays often consist of millions of tiny chips (

Fields of Study & Subjects

Advanced optical system design GaN-based semiconductor devices and materials Plasma Diagnostics and Applications

Publication details

Journal / source
Research
Publisher
American Association for the Advancement of Science (AAAS)
Volume
9
Pages
1214–1214
Publication date
1 January 2026
Language
EN