Projekt: KI4KMU - SPION - "Selbstlernende Prüfung von individuellen Oberflächen und Naturholzprodukten"

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Authors: Patrick Telders, Franz‐Barthold Gockel, Volker Geneiß, Christian Wöhler, Tom Sander, Felix Haneke, Mahdi Faez, Gräf, Tilmann
Cited by: 0

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Surface Roughness and Optical Measurements Non-Destructive Testing Techniques

Publication details

Journal / source
RENATE
Publication date
29 January 2026
Language
DE