Electrically tunable benchtop microscope

Kaggle 2026 Dataset Open access

Read full text
Authors: Soumyajit Podder
DOI: 10.34740/kaggle/dsv/14957739
Cited by: 0

Fields of Study & Subjects

Image Processing Techniques and Applications Advanced Fluorescence Microscopy Techniques Advanced Electron Microscopy Techniques and Applications

Publication details

Journal / source
Kaggle
Publication date
25 February 2026
Language
EN
Document type
Dataset