X-ray diffraction of ZnIn2S4 layers on FTO deposited using RF magnetron sputtering
Fields of Study & Subjects
Chalcogenide Semiconductor Thin Films
ZnO doping and properties
Advanced Materials and Semiconductor Technologies
Publication details
- Journal / source
- MOST Wiedzy
- Publication date
- 20 January 2026
- Language
- EN
- Document type
- Dataset