Detail analysis of reflection behavior for O-band and C-band silicon waveguides by OFDR profiles
Abstract
Abstract The multiple reflection behavior in the silicon waveguides observed in optical frequency-domain reflectometry (OFDR) profiles was analytically formulated, and the derived equations were found to accurately reproduce the reflection characteristics observed in both the OFDR reflection and transmission profiles. The extracted propagation loss and reflection coefficient for O-band and C-band single-mode waveguides exhibit strong dependence on the waveguide width. The backscattering loss caused by reflections in the silicon waveguide is estimated to account for approximately 5%–10% of the total propagation loss.
Fields of Study & Subjects
Photonic and Optical Devices
Photorefractive and Nonlinear Optics
Advanced Fiber Optic Sensors
Publication details
- Journal / source
- Japanese Journal of Applied Physics
- Volume
- 65
- Issue
- 4
- Pages
- 04SP06–04SP06
- Publication date
- 28 January 2026