Direct measurement of adhesion energy of reduced graphene oxide on SiO 2

Abstract Reduced graphene oxide (rGO) is a cost-effective, solution-processable material that enabling printed coatings and flexible electronics. While electrical transport and stiffness have been extensively characterized, quantitative interfacial adhesion—critical for fabrication yield and operational stability—remains poorly understood. Here, we measure the adhesion of rGO on SiO 2 by combining a nanoparticle-intercalated blister method with AFM nanoindentation. Adhesion energy is 0.64 ± 0.11 J m −2 , about four times higher than pristine graphene, indicating the contribution of residual oxygen functionalities. These quantitative metrics place rGO within the graphene–GO property map and offer guidance for scalable device integration